The infrared (IR) scattering-type scanning near-field optical
microscope neaSNOM provides state-of-the-art laterally
resolved (10 nm) IR spectroscopy and complements the existing
far-field IR spectroscopy (averaging over μm to mm areas)
techniques. The system is able to position samples with
nanometer accuracy for the reliable measurement of local
near-field spectra. To cover the necessary wavenumber range a
broad band "white light" source (supercontinuum
laser, 5-15 μm) is used. In addition, high spectral
resolution (of 3.2 cm-1) enables observation of
narrow vibrational bands and detection of any variations
caused, for example, by degradation, orientation changes or
doping. In order to measure high-quality IR spectra with an
excellent signal-to-noise ratio (via long integration times),
precise positioning of the metallic tip (for near-field
scattering) and an extremely small temporal drift of the tip
are ensured. An additional narrow-band but intense IR light
source (a quantum cascade laser) is also attached so that fast
imaging and data collection is available with a resolution
well below the diffraction limit.
For more information please
contact Dr. Christian
Huck.
