Oxford Systems Jupiter XR Atomic Force Microscope

The Asylum Research Jupiter XR Atomic Force Microscope from Oxford Instruments is a large-sample AFM designed to combine high-speed imaging and high resolution with an extended scanning range in a single system. It provides 200 mm sample access and a large scan range of 100µm, while the integrated blueDrive Tapping Mode improves measurement stability and reproducibility.

The system includes, in addition to the basic operating modes (Contact Mode, Tapping Mode, LFM, etc.), also nanomechanical modes (e.g., AM-FM, FFM, CR-AFM) as well as nanoelectrical and electromechanical modes (e.g., EFM, PFM, KPFM, and DART).

Kontakt

Sophia Klubertz sophia.klubertz@uni-heidelberg.de
Lisa Kutek lisa.kutek@imseam.uni-heidelberg.de